Análisis arqueométrico de pigmentos del sitio arqueológico Tambo Colorado por difracción de rayos X sincrotrón

Translated title of the contribution: Archaeometrical analysis of pigments from tambo colorado archaeological site by synchrotron x-ray diffraction

Elvira Leticia Zeballos Velasquez, Véronique Wright, Leopoldo Suescun, Esteban Asto

Research output: Contribution to journalArticlepeer-review

Abstract

Despite the exceptional architecture and polychromy of archaeological site of Tambo Colorado, there has been no conservation work or in the architectural structures of raw earth, nor on the surfaces. These jobs re-quire a proper understanding of the state of conservation of the site architecture and the analysis of the mate-rials used. With this purpose, the results of the present study tries to explain the nature of the materials (pig-ments) used in the mural paintings, as well as determine the sources of these materials (quarries). To do this, pigments of quarry were investigated by the technique of X-ray diffraction, using synchrotron radiation, and structural refinement by the Rietveld method. It was determined the composition of pigments, identifying the phases of anorthite, quartz, hematite, chlorite, halite, gypsum, orthoclase, illite, jarosite, calcite, kaolinite, zinwaldite, cristobalite, anhydrite and albite. Rietveld refinement confirmed the presence of these phases and determined the percentage by weight of each of them.

Translated title of the contributionArchaeometrical analysis of pigments from tambo colorado archaeological site by synchrotron x-ray diffraction
Original languagePortuguese
Article numbere-12321
JournalRevista Materia
Volume24
Issue number1
DOIs
StatePublished - 2019
Externally publishedYes

Bibliographical note

Funding Information:
Use of the Advanced Photon Source at Argonne National Laboratory was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.

Publisher Copyright:
© 2019, Universidade Federal do Rio de Janeiro. All rights reserved.

Copyright:
Copyright 2019 Elsevier B.V., All rights reserved.

Keywords

  • Pigments
  • Rietveld method
  • Synchrotron radiation
  • X-ray diffraction

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