Characterization of resonant tunneling paths in current-voltage characteristics line shapes

P. H. Rivera, P. A. Schulz

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

We analyze the current density-voltage characteristics of double-barrier tunneling diodes, with different spacer layers, within the framework of a Poisson solver together with a coherent tunneling approximation for transmission probabilities. We show that varying the spacer layer thickness, together with barrier heights, changes dramatically the current density-voltage characteristics line shape, which is revealed to be an important qualitative signature of the tunneling paths involved in the double-barrier diodes under operation.© 1995 American Institute of Physics.
Original languageAmerican English
Pages (from-to)2675
Number of pages1
JournalApplied Physics Letters
DOIs
StatePublished - 1 Jan 1995
Externally publishedYes

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