Characterization of resonant tunneling paths in current-voltage characteristics line shapes

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We analyze the current density-voltage characteristics of double-barrier tunneling diodes, with different spacer layers, within the framework of a Poisson solver together with a coherent tunneling approximation for transmission probabilities. We show that varying the spacer layer thickness, together with barrier heights, changes dramatically the current density-voltage characteristics line shape, which is revealed to be an important qualitative signature of the tunneling paths involved in the double-barrier diodes under operation.

Original languageEnglish
Pages (from-to)2675
Number of pages1
JournalApplied Physics Letters
Volume67
DOIs
StatePublished - 1995
Externally publishedYes

Fingerprint Dive into the research topics of 'Characterization of resonant tunneling paths in current-voltage characteristics line shapes'. Together they form a unique fingerprint.

Cite this