Er3+-doped tellurite glass waveguides produced by Fiber on Glass (FOG) method

V. A.G. Rivera, E. Rodriguez, E. F. Chillcce, I. O. Mazali, C. L. Cesar, L. C. Barbosa

Research output: Contribution to conferencePaper

Abstract

In this work we used a Thermal Mechanic Analysis equipment to produce the channel FOG waveguides by pressing an Er3+ doped tellurite glass optical fiber against one Er3+ ion doped tellurite glass substrate kept under Tc ±30 °C (Tc = soft point). The luminescence and waveguide refractive index were measured. Scanning electron microscopy was used to observe the obtained structure. The objective is to produce a new concept in components of integrated optical circuits. Then this work report the production of Er3+-doped tellurite glass channel waveguides using the novel concept of Benson et al[1] of fiber on glass (FOG). To succeed with this technique it is important to correlate the main thermo-physical characteristics of the substrate and the fiber, which are the transition temperature Tg, the temperature of the onset of crystallization Tx, the maximum crystallization temperature T c and the thermal expansion coefficient. The Tg, Tx and Tc values were determined by Differential Thermal Analysis (DTA), while the thermal expansion coefficient was determined by Thermal Mechanical Analysis (TMA). For the FOG purpose the thermal stability range, Tx - T g, is an important temperature region which defines if the glass will have enough viscosity to shape in the FOG concept.
Original languageAmerican English
DOIs
StatePublished - 8 May 2006
Externally publishedYes
EventProceedings of SPIE - The International Society for Optical Engineering -
Duration: 1 Jan 2015 → …

Conference

ConferenceProceedings of SPIE - The International Society for Optical Engineering
Period1/01/15 → …

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    Rivera, V. A. G., Rodriguez, E., Chillcce, E. F., Mazali, I. O., Cesar, C. L., & Barbosa, L. C. (2006). Er3+-doped tellurite glass waveguides produced by Fiber on Glass (FOG) method. Paper presented at Proceedings of SPIE - The International Society for Optical Engineering, . https://doi.org/10.1117/12.647152