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Growth process and grain boundary defects in Er doped BaTiO<inf>3</inf> processed by EB-PVD: A study by XRD, FTIR, SEM and AFM
J. L. Clabel H., Iram T. Awan, V. A.G. Rivera, I. C. Nogueira, M. A. Pereira-da-Silva, M. Siu Li, S. O. Ferreira, E. Marega
Research output: Contribution to journal › Article › peer-review
12
Scopus
citations