Fingerprint
Dive into the research topics of 'Growth process and grain boundary defects in Er doped BaTiO<inf>3</inf> processed by EB-PVD: A study by XRD, FTIR, SEM and AFM'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Growth process and grain boundary defects in Er doped BaTiO<inf>3</inf> processed by EB-PVD: A study by XRD, FTIR, SEM and AFM
J. L. Clabel H., Iram T. Awan, V. A.G. Rivera, I. C. Nogueira, M. A. Pereira-da-Silva, M. Siu Li, S. O. Ferreira, E. Marega
Research output: Contribution to journal › Article › peer-review
26
Scopus
citations