Growth process and grain boundary defects in Er doped BaTiO<inf>3</inf> processed by EB-PVD: A study by XRD, FTIR, SEM and AFM

J. L. Clabel H., Iram T. Awan, V. A.G. Rivera, I. C. Nogueira, M. A. Pereira-da-Silva, M. Siu Li, S. O. Ferreira, E. Marega

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'Growth process and grain boundary defects in Er doped BaTiO<inf>3</inf> processed by EB-PVD: A study by XRD, FTIR, SEM and AFM'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds

Medicine & Life Sciences