Multilayered samples reconstructed by measuring K<inf>α</inf>/K <inf>β</inf> or L<inf>α</inf>/L<inf>β</inf> X-ray intensity ratios by EDXRF

Roberto Cesareo, Joaquim T. De Assis, Clodoaldo Roldán, Angel D. Bustamante, Antonio Brunetti, Nick Schiavon

Research output: Contribution to journalArticlepeer-review

54 Scopus citations

Fingerprint

Dive into the research topics of 'Multilayered samples reconstructed by measuring K<inf>α</inf>/K <inf>β</inf> or L<inf>α</inf>/L<inf>β</inf> X-ray intensity ratios by EDXRF'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science

Physics